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EPSRC NetworkPlus in Terahertz Systems

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Showing 51 to 60 of 238 users

Dr Darren Graham avatar

Dr Darren Graham

Head of Research for Department of Physics and Astronomy

The University of Manchester

Academia
SIG 2: Solid State and Quantum Materials, Devices and Systems SIG 6: Non-Destructive Testing, Security and Process Monitoring

Mr David Denman

Manufacturing Engineer CNC

Parker Meggitt Engineered Materials Group

Industry
SIG 6: Non-Destructive Testing, Security and Process Monitoring

Mr David Haskett

CEO

Subtera

Industry
SIG 6: Non-Destructive Testing, Security and Process Monitoring

Mr David Reece

VP Business Development

TERAVIEW LTD

Industry
SIG 1: High-Frequency Electronics and Communication Systems SIG 6: Non-Destructive Testing, Security and Process Monitoring

Professor David Citrin

Professor

Georgia Institute of Technology

Academia
SIG 3: Healthcare SIG 6: Non-Destructive Testing, Security and Process Monitoring

Dr Dayi Zhang

Knowledge Exchange Lead

University of Strathclyde

Industry Research and technology organisation
SIG 6: Non-Destructive Testing, Security and Process Monitoring

Dr Deepak Kumar

Research fellow

University of Leeds

Academia
SIG 1: High-Frequency Electronics and Communication Systems SIG 2: Solid State and Quantum Materials, Devices and Systems SIG 3: Healthcare SIG 4: Chemical and Biological Systems SIG 5: Astronomy and Earth Observation SIG 6: Non-Destructive Testing, Security and Process Monitoring

Dr Diksha Garg

Postdoctoral Research Fellow

University of Exeter

Academia
SIG 3: Healthcare SIG 4: Chemical and Biological Systems SIG 6: Non-Destructive Testing, Security and Process Monitoring

Dr Divya Jayasankar

Researcher

German Aerospace Center (DLR e.V.)

Research and technology organisation
SIG 1: High-Frequency Electronics and Communication Systems SIG 5: Astronomy and Earth Observation

Professor Eddie Ball

Professor of RF Engineering

The University of Sheffield

Academia
SIG 1: High-Frequency Electronics and Communication Systems SIG 2: Solid State and Quantum Materials, Devices and Systems SIG 6: Non-Destructive Testing, Security and Process Monitoring

Showing 51 to 60 of 238 users